Desktop Measurement Instruments

    Desktop Measurement Instruments

    Fischer's desktop coating thickness instruments – utilizing either X-ray fluorescence or tactile measurement technology with diverse probes – provide unbeatable performance and flexibility. Because of the broad range of measurement techniques they apply, they offer the right solution for any task. Desktop instruments can be integrated easily into production and quality management systems via software and hardware interfaces.

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    One instrument, three job descriptions: not only is the flexible XAN®500 a handheld XRF device, it also converts into a desktop unit and can be integrated into production lines.

    MMS PC2

    Modular system for diverse measurement techniques: ideal for variable tasks in connection with coating thickness measurement and material testing.


    Coating thickness measurement by means of the beta backscatter method: for thin layers even less than 3 µm, as well as soft layers or plastic coatings.

    Couloscope CMS2

    Desktop instrument for thickness measurement of virtually all metallic coatings, including multi-layers, on either metallic or non-metallic substrates.


    The X-ray fluorescence devices of the GOLDSCOPE family are designed specifically to analyze gold and other precious metals


    Measurement instruments for fast and cost-effective analysis of gold jewelry and other precious metals.

    XUL / XULM

    Robust instruments based on X-ray fluorescence for fast and cost-effective coating thickness measurement, especially in the electroplating industry.


    The all-rounder: with comprehensive configuration options, XDL instruments are ideal for manual measurements or serial testing of coating thicknesses and material compositions.


    The FISCHERSCOPE® XDV-SDD was designed to meet the highest demands in coating thickness measurement and material analysis.


    With its XDV-μ series, Fischer offers instruments for testing the smallest of structures, e.g. in the electronics or jewelery industries.


    X-ray fluorescence instruments with vacuum chamber for analyzing light elements.